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A MICROWELDER FOR THE PREPARATION OF ELECTRON MICROSCOPE CENTRAL WIRE BEAM-STOPPING APERTURESBROWN JN.1972; J. MICR.; G.B.; DA. 1972; VOL. 96; NO 3; PP. 393-395; BIBL. 4 REF.Serial Issue

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Information transfer in transmission electron microscopyROSE, H.Ultramicroscopy. 1984, Vol 15, Num 3, pp 173-191, issn 0304-3991Article

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Contrast of heavily decorated dislocations in optical birefringence micrographsTANNER, B. K.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1984, Vol 49, Num 3, pp 435-444, issn 0141-8610Article

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ANALOGUE INVESTIGATIONS OF ELECTRIC FIELD DISTRIBUTION AND ION TRAJECTORIES IN THE FIELD ION MICROSCOPE.BIRDSEYE PJ; SMITH DA; SMITH GDW et al.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1642-1651; BIBL. 16 REF.Article

ENERGY SPECTRUM OF FIELD IONIZATION AT A SINGLE ATOMIC SITEMULLER EW; KRISHNASWAMY SV.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 36; NO 1; PP. 29-47; BIBL. 32 REF.Serial Issue

REAL-SPACE METHODS FOR INTERPRETING ELECTRON MICROGRAPHS IN CROSS-GRATING ORIENTATIONS. I. EXACT WAVE-MECHANICAL FORMULATION.OZORIO DE ALMEIDA AM.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 4; PP. 435-442; BIBL. 17 REF.Article

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ABBILDUNGSERSCHEINUNGEN AN ISOLATORSCHICHTEN IM ELEKTRONENSPIEGELMIKROSKOP UNTER STATIONAEREN AUFLADUNGSBEDINGUNGEN. = APPARITION D'IMAGES DE COUCHES ISOLANTES DANS UN MICROSCOPE ELECTRONIQUE A MIROIR SOUS DES CONDITIONS STATIONNAIRES DE CHARGEMENTWEIDNER G; WEISSMANTEL C; HERBERGER J et al.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 3; PP. 285-293; ABS. ANGL.; BIBL. 13 REF.Article

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